Huygens Deconvolution

Cornell Scientific is associated with Scientific Volume Imaging which offers Huygens Deconvolution and Analysis software for Confocal, Widefield & Brightfield, Spinning disk, Multi-photon, Rescan, STED, Array Detector, and SPIM/light sheet microscopy with fully automatic depth-dependent PSF measurement as well as bead-based PSF measurement.

SVI Huygens is the top solution for Deconvolution with solutions for all different and latest microscopic techniques.

             For More Details click here